Assignee
ONISHI TADASHI
JP·1 granted patent·1 pending application·7 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0181US8634079B2Attraction state inspection device, surface mounting apparatus, and part test deviceONISHI TADASHI·Filed 2012·Granted Jan 21, 2014·7 cites·8 claims
- 0244US2012248064A1Substrate processing apparatus, substrate processing method and storage mediumONISHI TADASHI·Filed 2012·Application pending·0 cites
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