Assignee

OGAWA AKIO

JP·1 granted patent·1 pending application·3 citations·filing 2006–2009

Technology mixC30B1 G11B1

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2 records

0168US8138754B2Method and apparatus for testing characteristics of thin-film magnetic headOGAWA AKIO·Filed 2009·Granted Mar 20, 2012·3 cites·10 claims
0240US2007034144A1Oxide crystal growth apparatus and fabrication method using the sameOGAWA AKIO·Filed 2006·Application pending·0 cites

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