Assignee
NGR INC
JP·7 granted patents·6 pending applications·46 citations·filing 2007–2018
Top patents by PatentIndex Score
13 records- 0191US8045785B2Pattern inspection apparatus and methodNGR INC·Filed 2010·Granted Oct 25, 2011·32 cites·27 claims
- 0275US10446365B2Method of verifying operation parameter of scanning electron microscopeNGR INC·Filed 2018·Granted Oct 15, 2019·2 cites·3 claims
- 0375US9793091B1Image generation apparatusNGR INC·Filed 2016·Granted Oct 17, 2017·3 cites·7 claims
- 0473US7983471B2Pattern inspection apparatus and methodNGR INC·Filed 2007·Granted Jul 19, 2011·8 cites·34 claims
- 0565US10515778B2Secondary particle detection system of scanning electron microscopeNGR INC·Filed 2016·Granted Dec 24, 2019·1 cites·16 claims
- 0637US2017372464A1Pattern inspection method and pattern inspection apparatusNGR INC·Filed 2016·Application pending·0 cites
- 0736US2018300872A1Method And Apparatus For Integrated Circuit Pattern Inspection With Automatically Set Inspection AreasNGR INC·Filed 2017·Application pending·0 cites
- 0836US2018005797A1Scanning electron microscopeNGR INC·Filed 2016·Application pending·0 cites
- 0934US10515779B2Imaging system and imaging methodNGR INC·Filed 2018·Granted Dec 24, 2019·0 cites·7 claims
- 1034US10354375B2Method of utilizing information on shape of frequency distribution of inspection result in a pattern inspection apparatusNGR INC·Filed 2016·Granted Jul 16, 2019·0 cites·3 claims
- 1133US2018330494A1Method of detecting defect of contact holeNGR INC·Filed 2018·Application pending·0 cites
- 1228US2019026881A1Method of visualizing defect using design data and defect detection methodNGR INC·Filed 2018·Application pending·0 cites
- 1321US2019005650A1Pattern edge detection methodNGR INC·Filed 2018·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →