Assignee
MODUS TEST LLC
US·12 granted patents·1 pending application·24 citations·filing 2015–2023
Technology mixG01R9
Top patents by PatentIndex Score
13 records- 0194US11668731B2Force deflection and resistance testing system and method of useMODUS TEST LLC·Filed 2022·Granted Jun 6, 2023·2 cites·47 claims
- 0292US11674996B2Modular electronic testing system with flexible test PCB formatMODUS TEST LLC·Filed 2022·Granted Jun 13, 2023·2 cites·44 claims
- 0392US10705120B2Force deflection and resistance testing system and method of useMODUS TEST LLC·Filed 2018·Granted Jul 7, 2020·4 cites·23 claims
- 0489US11313880B2Force deflection and resistance testing system and method of useMODUS TEST LLC·Filed 2020·Granted Apr 26, 2022·2 cites·34 claims
- 0587US11385277B2Modular electronic testing system with flexible test PCB formatMODUS TEST LLC·Filed 2020·Granted Jul 12, 2022·2 cites·36 claims
- 0677US12560643B2Modular electronic testing system with flexible test PCB formatMODUS TEST LLC·Filed 2023·Granted Feb 24, 2026·0 cites·22 claims
- 0773US10788531B2Reduced cost package device simulator, manufacturing method and method of useMODUS TEST LLC·Filed 2015·Granted Sep 29, 2020·2 cites·29 claims
- 0866US12571833B2Force, deflection, resistance, and temperature testing system and method of useMODUS TEST LLC·Filed 2023·Granted Mar 10, 2026·0 cites·43 claims
- 0954USD927429SPlurality of contact fields for a printed circuit boardMODUS TEST LLC·Filed 2019·Granted Aug 10, 2021·6 cites·1 claims
- 1053US2024061015A1Low profile electronic testing system with flexible test pcb formatMODUS TEST LLC·Filed 2023·Application pending·0 cites
- 1148USD1087928SContact field for a printed circuit boardMODUS TEST LLC·Filed 2022·Granted Aug 12, 2025·1 cites·1 claims
- 1242USD933016SContact field for a printed circuit boardMODUS TEST LLC·Filed 2019·Granted Oct 12, 2021·3 cites·1 claims
- 1327USD1098054SContact field for a motherboard for an electronic testing systemMODUS TEST LLC·Filed 2022·Granted Oct 14, 2025·0 cites·1 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →