Assignee
MASUDA SHIN
JP·7 granted patents·28 citations·filing 2010–2011
Top patents by PatentIndex Score
7 records- 0190US8907696B2Test apparatus having optical interface and test methodMASUDA SHIN·Filed 2011·Granted Dec 9, 2014·11 cites·17 claims
- 0285US8224143B2Substrate structure and manufacturing methodMASUDA SHIN·Filed 2010·Granted Jul 17, 2012·5 cites·20 claims
- 0377US8885157B2Test apparatus, test method, and device interface for testing a device under test using optical signalingMASUDA SHIN·Filed 2011·Granted Nov 11, 2014·4 cites·20 claims
- 0470US8659750B2Test apparatus, test method, and device interfaceMASUDA SHIN·Filed 2011·Granted Feb 25, 2014·2 cites·17 claims
- 0568US8792792B2Light source, optical signal generator, and electrical signal generatorMASUDA SHIN·Filed 2011·Granted Jul 29, 2014·2 cites·17 claims
- 0668US8279379B2Light receiving device, light receiving device manufacturing method, and light receiving methodMASUDA SHIN·Filed 2010·Granted Oct 2, 2012·2 cites·11 claims
- 0764US8712252B2Optical signal output apparatus, electrical signal output apparatus, and test apparatusMASUDA SHIN·Filed 2011·Granted Apr 29, 2014·2 cites·30 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →