Assignee
MAMIYA TAKAHIRO
JP·4 granted patents·12 citations·filing 2008–2013
Top patents by PatentIndex Score
4 records- 0181US8436890B2Three-dimensional measuring device and board inspection deviceMAMIYA TAKAHIRO·Filed 2008·Granted May 7, 2013·9 cites·20 claims
- 0263US8131061B2Apparatus for inspecting solder printingMAMIYA TAKAHIRO·Filed 2008·Granted Mar 6, 2012·1 cites·20 claims
- 0361US8233700B2Solder printing inspection apparatus and component mounting systemMAMIYA TAKAHIRO·Filed 2009·Granted Jul 31, 2012·2 cites·20 claims
- 0446US10215556B2Three-dimensional measuring apparatusMAMIYA TAKAHIRO·Filed 2013·Granted Feb 26, 2019·0 cites·10 claims
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