Assignee
LEHIGHTON ELECTRONICS INC
US·8 granted patents·1 pending application·89 citations·filing 1985–2014
Top patents by PatentIndex Score
9 records- 0166US6791339B2Method and apparatus for nondestructive measurement and mapping of sheet materialsLEHIGHTON ELECTRONICS INC·Filed 2002·Granted Sep 14, 2004·14 cites·15 claims
- 0262US6443002B2Method and apparatus for testing of sheet materialLEHIGHTON ELECTRONICS INC·Filed 2001·Granted Sep 3, 2002·8 cites·19 claims
- 0361US4667154AElectrical contact assemblyLEHIGHTON ELECTRONICS INC·Filed 1985·Granted May 19, 1987·27 cites·4 claims
- 0459US6202482B1Method and apparatus for testing of sheet materialLEHIGHTON ELECTRONICS INC·Filed 1999·Granted Mar 20, 2001·21 cites·24 claims
- 0556US2016313388A1Noncontact sensing of maximum open-circuit voltagesLEHIGHTON ELECTRONICS INC·Filed 2014·Application pending·0 cites
- 0655US7109724B2Method and apparatus for nondestructive measurement and mapping of sheet materialsLEHIGHTON ELECTRONICS INC·Filed 2004·Granted Sep 19, 2006·9 cites·20 claims
- 0755US6711948B2Method and apparatus for testing of sheet materialLEHIGHTON ELECTRONICS INC·Filed 2002·Granted Mar 30, 2004·5 cites·18 claims
- 0854US8996103B2Sheet conductance/resistance measurement systemLEHIGHTON ELECTRONICS INC·Filed 2013·Granted Mar 31, 2015·0 cites·12 claims
- 0933US6205852B1Method and apparatus for testing of sheet materialLEHIGHTON ELECTRONICS INC·Filed 1999·Granted Mar 27, 2001·5 cites·9 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →