Assignee
KOOK TAEHO
US·2 granted patents·0 citations·filing 2006–2011
Technology mixH10D2
Top patents by PatentIndex Score
2 records- 0143US8241986B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2011·Granted Aug 14, 2012·0 cites·8 claims
- 0242US8089130B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2006·Granted Jan 3, 2012·0 cites·10 claims
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