Assignee
KAITO TAKASHI
JP·3 granted patents·7 citations·filing 2007–2008
Top patents by PatentIndex Score
3 records- 0176US8274063B2Composite focused ion beam device, process observation method using the same, and processing methodKAITO TAKASHI·Filed 2008·Granted Sep 25, 2012·4 cites·20 claims
- 0271US8269194B2Composite focused ion beam device, and processing observation method and processing method using the sameKAITO TAKASHI·Filed 2008·Granted Sep 18, 2012·3 cites·19 claims
- 0353US8728286B2Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the sameKAITO TAKASHI·Filed 2007·Granted May 20, 2014·0 cites·7 claims
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