Assignee

IWAHASHI TAKASHI

JP·2 granted patents·2 citations·filing 2008–2009

Technology mixG01B2 G01N1 G06T1

Top patents by PatentIndex Score

2 records

0154US8285028B2Inspection apparatus and inspection methodIWAHASHI TAKASHI·Filed 2008·Granted Oct 9, 2012·2 cites·14 claims
0238US8300921B2Inspection apparatus and inspection methodIWAHASHI TAKASHI·Filed 2009·Granted Oct 30, 2012·0 cites·11 claims

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