Assignee
ISHIMARU ICHIRO
JP·3 granted patents·2 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0164US8830462B2Optical characteristic measurement device and optical characteristic measurement methodISHIMARU ICHIRO·Filed 2012·Granted Sep 9, 2014·2 cites·15 claims
- 0255US8729514B2Surface inspection apparatus and method thereofISHIMARU ICHIRO·Filed 2011·Granted May 20, 2014·0 cites·19 claims
- 0340US8988689B2Spectroscopic measurement device and spectroscopic measurement methodISHIMARU ICHIRO·Filed 2011·Granted Mar 24, 2015·0 cites·20 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →