Assignee

INTERUNIVERSITAIR MICORELEKTRO

BE·1 granted patent·17 citations·filing 1998–1998

Technology mixG01R1

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0139US6136619AMethod for measuring electromigration-induced resistance changesINTERUNIVERSITAIR MICORELEKTRO·Filed 1998·Granted Oct 24, 2000·17 cites·10 claims

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