Assignee
HIBINO TAKASHI
JP·2 granted patents·2 pending applications·2 citations·filing 2004–2011
Top patents by PatentIndex Score
4 records- 0163US8803516B2Eddy current testing method and apparatus for inspecting an object for flawsHIBINO TAKASHI·Filed 2009·Granted Aug 12, 2014·2 cites·6 claims
- 0249US2006282916A1Genes controlling plant cell wall formationHIBINO TAKASHI·Filed 2004·Application pending·0 cites
- 0346US2011320131A1Biological information processing apparatus, biological information display apparatus, telemedical system, telemedical method, processing control program, display control program, and storage mediumHIBINO TAKASHI·Filed 2011·Application pending·0 cites
- 0436US8638091B2Rotary eddy current testing probe deviceHIBINO TAKASHI·Filed 2011·Granted Jan 28, 2014·0 cites·5 claims
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