Assignee
HENG FOOK-LUEN
US·4 granted patents·17 citations·filing 2009–2012
Technology mixG06F4
Top patents by PatentIndex Score
4 records- 0185US8423941B2Structural migration of integrated circuit layoutHENG FOOK-LUEN·Filed 2011·Granted Apr 16, 2013·9 cites·25 claims
- 0277US8522173B2Spatial correlation-based estimation of yield of integrated circuitsHENG FOOK-LUEN·Filed 2012·Granted Aug 27, 2013·4 cites·6 claims
- 0368US8276102B2Spatial correlation-based estimation of yield of integrated circuitsHENG FOOK-LUEN·Filed 2010·Granted Sep 25, 2012·2 cites·15 claims
- 0462US8108803B2Geometry based electrical hotspot detection in integrated circuit layoutsHENG FOOK-LUEN·Filed 2009·Granted Jan 31, 2012·2 cites·10 claims
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