Assignee
FUKASE TAKAHIRO
JP·6 granted patents·15 citations·filing 2014–2019
Top patents by PatentIndex Score
6 records- 0184US9524545B2Apparatus, system, method and storage medium for image inspection result determination and verifying false defect detections due to position matching errorsFUKASE TAKAHIRO·Filed 2014·Granted Dec 20, 2016·8 cites·9 claims
- 0279US10402961B2Inspection apparatus, inspection system, inspection method, and recording mediumFUKASE TAKAHIRO·Filed 2017·Granted Sep 3, 2019·4 cites·18 claims
- 0377US9900474B2Color processing apparatus, inspection apparatus, and color processing methodFUKASE TAKAHIRO·Filed 2016·Granted Feb 20, 2018·3 cites·8 claims
- 0445US10440233B2Image processing apparatus, image processing method, and mediumFUKASE TAKAHIRO·Filed 2019·Granted Oct 8, 2019·0 cites·6 claims
- 0544US9019526B2Image examination apparatus, image examination system, and image examination methodFUKASE TAKAHIRO·Filed 2014·Granted Apr 28, 2015·0 cites·11 claims
- 0639US10326916B2Inspection apparatus, inspection method and storage mediumFUKASE TAKAHIRO·Filed 2018·Granted Jun 18, 2019·0 cites·9 claims
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