Assignee
DETOFSKY ABRAM M
US·3 granted patents·19 citations·filing 2010–2013
Top patents by PatentIndex Score
3 records- 0185US9059803B2Mechanism for facilitating an optical instrumentation testing system employing multiple testing pathsDETOFSKY ABRAM M·Filed 2012·Granted Jun 16, 2015·12 cites·24 claims
- 0284US8710858B2Micro positioning test socket and methods for active precision alignment and co-planarity feedbackDETOFSKY ABRAM M·Filed 2010·Granted Apr 29, 2014·7 cites·14 claims
- 0340US9506980B2Integrated circuit testing architectureDETOFSKY ABRAM M·Filed 2013·Granted Nov 29, 2016·0 cites·22 claims
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