Assignee
BEAMIND
FR·0 granted patents·3 pending applications·0 citations·filing 2007–2007
Top patents by PatentIndex Score
3 records- 0143US2008006427A1Method and System for Testing or Measuring Electrical Elements, Using Two Offset PulsesBEAMIND·Filed 2007·Application pending·0 cites
- 0237US2008018349A1Method for testing electrical elements using an indirect photoelectric effectBEAMIND·Filed 2007·Application pending·0 cites
- 0311US2008143355A1Method and System for Testing or Measuring Electrical ElementsBEAMIND·Filed 2007·Application pending·0 cites
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