Assignee
AKIYAMA HAJIME
JP6 patents
Top patents by PatentIndex Score
US9347988B2May 24, 2016
Semiconductor testing jig and semiconductor testing method performed by using the same
AKIYAMA HAJIME9 citations83
US8125045B2Feb 28, 2012
Dielectric isolation type semiconductor device and manufacturing method therefor
AKIYAMA HAJIME2 citations62
US9312160B2Apr 12, 2016
Wafer suction method, wafer suction stage, and wafer suction system
AKIYAMA HAJIME0 citations51
US8823360B2Sep 2, 2014
Semiconductor device
AKIYAMA HAJIME1 citations51
US8110449B2Feb 7, 2012
Semiconductor device and method of manufacturing the same
AKIYAMA HAJIME0 citations51
US8071454B1Dec 6, 2011
Method for manufacturing dielectric isolation type semiconductor device
AKIYAMA HAJIME1 citations51